The group will always adhere to the corporate core values of "quality first, customer first", continue to integrate professional and technical personnel in the failure analysis for presenting clear findings, failure analysis for increasing profitability, failure analysis for controlling costs field, and strive to build an international competitive high-end industry. Our team works hard to optimize the production process and add features to our failure analysis for large enterprises to help customers improve efficiency. All our employees follow the tenet of customer first, based on becoming an enterprise with first-class quality and first-class service. In the future, we will continue to provide new and old customers with high-quality products and excellent services. Because we are professional and responsible, so customers are assured and satisfied. All staff of the company are looking forward to your presence and cooperation for common development. In the future, we will continue to adhere to the core concept of "innovation creates value" and enter a new stage of development of product innovation and service innovation. Based on the principle of meeting customer needs and improving customer satisfaction, we proactively serve customers. In the business process, our company in research and development, testing, product quality management has become a significant industry competitive advantage.
  • AEC-Q102 Product Test of Optoelectronic Devices
    AEC, composed of Ford, Chrysler and General Motors, has issued the reliability standard AEC-Q102 for optoelectronic devices, which sets strict test requirements for the reliability of optoelectronic
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  • Advanced FIB & TEM For Wafers Analysis
    Advanced process wafer-level FIB sample preparation and TEM analysis services provide precise sample preparation and structural analysis solutions for advanced process chips by performing FIB sample
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  • DB-FIB (Dual-Beam Focused Ion Beam)
    GRGTEST Metrology provides professional dual-beam focused ion beam (DB-FIB) analysis services. Popular testing services include TEM sample sections for advanced processes (14 nm and below), FA
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  • AFM (Atomic Force Microscopy) Analysis
    The Bruker Dimension ICON6 atomic force microscope supports 12 modes, including contact, tapping, and peak force tapping, to meet the testing needs of different samples and provide diverse testing
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  • Chip-Level ESD Testing
    Chip-level ESD (Electrostatic Discharge) testing is a reliability test for Integrated Circuits (ICs) used to evaluate a chip's ability to resist electrostatic discharge interference during
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  • AEC-Q200 Product Test of Resistance-capacitance Inductanc...
    AEC-200 test standard specifies in detail the operating temperature range of passive components in each component environment in the car, strictly distinguishes the test items of various components,
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  • AEC-Q101 Certification Test for Semiconductor Discrete De...
    AEC-Q101 has sorted out the vehicle reliability requirements for various semiconductor discrete devices. AEC-Q101 test serves as not only a report that can be used worldwide on the reliability of
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  • AEC-Q100 Certification Testing
    The AEC-Q technical team of GRGT Failure Analysis Laboratory has executed a large number of AEC-Q test cases and accumulated rich experience in certification testing, which can provide you with more
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  • AEC-Q 104 Certification Testing
    GRGT provides a complete set of AEC-Q 104 certification testing and certification services. By using various testing and analysis techniques and programs to confirm the failure phenomena of products,
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  • AEC-Q Certification Testing for Automotive
    As an accepted test specification for automotive-level electronic components in the world, AEC-Q has become a symbol of the quality and reliability in automotive components. AEC-Q certification
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  • X-Ray NDT Testing
    X-Ray NDT Testing is a mature non-destructive testing method widely used in material inspection (IQC), failure analysis (FA), quality control (QC), quality assurance and reliability (QA/REL),
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  • Surface Insulation Resistance (SIR) Test
    The Surface Insulation Resistance (SIR) test can be used to evaluate problems caused by short circuits or current leaks between metal conductors, helping to identify whether any flux or other
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Wendy Hiser star star star star star
These companies adhering to the customer first, forge ahead of the business philosophy, adhere to the principle of customer first to provide our customers with quality service.
Sherrie Watts star star star star star
Your delivery speed is very fast, and the courier can communicate with us in a timely manner.
Melissa Myers star star star star star
Quality products are the golden key to open the market door. It is knowing this that this company can achieve today's results. Their good products give them a solid customer base.
Hortense Paris star star star star star
If there is no accident, we will buy it back in the future, because the products are reasonable in price, high in quality, and very valuable.
Nancy Fair star star star star star
The customer service of this supplier is good.
Eric Jones star star star star star
We have been working with you for many years and I have to say that you are a company that makes us feel at ease.
chemical plasticizer analysis test, failure analysis for collaborating across departments, full scale test implements the development strategy of "high-end entry, comprehensive expansion, and three-dimensional deep cultivation". We are professional failure analysis for large enterprises service provider in China, providing the best labs and solutions. Please feel free to contact us for quotation.
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