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AEC-Q 104 Certification TestingGRGT provides a complete set of AEC-Q 104 certification testing and certification services. By using various testing and analysis techniques and programs to confirm the failure phenomena of products,read more
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AFM (Atomic Force Microscopy) AnalysisThe Bruker Dimension ICON6 atomic force microscope supports 12 modes, including contact, tapping, and peak force tapping, to meet the testing needs of different samples and provide diverse testingread more
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PFIB (Plasma Focused Ion Beam)Compared to traditional gallium-ion focused ion beam (Ga-FIB), PFIB utilizes a more powerful xenon (Xe) ion beam, achieving a maximum current of 2.5 μA at 30 keV energy, which increases its etchingread more
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Component Corrosion VerificationFocusing on components prone to corrosion such as resistors, capacitors, magnetic beads, LEDs, IGBTs, PCBs, microwave/RF ceramic package solder, bare chip PADs, etc., as well as protective processesread more
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AEC-Q200 Product Test of Resistance-capacitance Inductanc...AEC-200 test standard specifies in detail the operating temperature range of passive components in each component environment in the car, strictly distinguishes the test items of various components,read more
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AEC-Q102 Product Test of Optoelectronic DevicesAEC, composed of Ford, Chrysler and General Motors, has issued the reliability standard AEC-Q102 for optoelectronic devices, which sets strict test requirements for the reliability of optoelectronicread more
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AEC-Q101 Certification Test for Semiconductor Discrete De...AEC-Q101 has sorted out the vehicle reliability requirements for various semiconductor discrete devices. AEC-Q101 test serves as not only a report that can be used worldwide on the reliability ofread more
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AEC-Q100 Certification TestingThe AEC-Q technical team of GRGT Failure Analysis Laboratory has executed a large number of AEC-Q test cases and accumulated rich experience in certification testing, which can provide you with moreread more
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AEC-Q Certification Testing for AutomotiveAs an accepted test specification for automotive-level electronic components in the world, AEC-Q has become a symbol of the quality and reliability in automotive components. AEC-Q certificationread more
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IGBT and Semiconductor TestingGRGT has invested more than 300 sets of high-end detection and analysis equipment, formed a team of talents with doctors and experts as the core, and created 6 special laboratories for equipmentread more
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Microstructure Analysis and Evaluation of Semiconductor M...With the continuous development of large-scale integrated circuits, the chip manufacturing process is becoming more and more complex, and the abnormal microstructure and composition of semiconductorread more
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Surface Insulation Resistance (SIR) TestThe Surface Insulation Resistance (SIR) test can be used to evaluate problems caused by short circuits or current leaks between metal conductors, helping to identify whether any flux or otherread more
WEBWhat is AEC-Q200? The AEC-Q200 is a failure mechanism-based stress test qualification that focuses specifically on passive electronic components. This certification requires a...
WEBThe AEC-Q104 is a global standard that defines the minimum stress test requirements and conditions for qualification of multichip modules (MCM) used in the automotive industry....
WEBAEC-Q200 REV D June 1, 2010 Component Technical Committee Automotive Electronics Council Page 2 of 74 Acknowledgement Any Document involving a complex technology...
WEB知乎专栏提供一个自由写作和表达平台,让用户随心所欲分享知识和观点。...
WEBThe Many AEC-Q Standards AEC-Q100 AEC-Q101 AEC-Q102 AEC-Q200 AEC - Q100-007 - Rev-B: Fault Simulation and Test Grading AEC - Q100-008 - Rev-A: Early Life...
WEBNov 27, 2019 · AEC-Q100 is a failure mechanism based stress test qualification for packaged integrated circuits used in automotive applications. This specification has...
