Service Content
|
Test Item |
Quotation Unit |
Sample Type |
|
Cross-section Processing & Metrology |
Hour (h) |
Semiconductor samples such as 3D NAND, DRAM, MEMS; other samples requiring large-size (>50µm) processing |
|
Large-size TEM XS (Cross-section) Sample Preparation |
Hour (h) |
Same as above |
|
Large-size TEM PV (Plan-view) Sample Preparation |
Hour (h) |
Same as above |
|
Microfabrication (Etching or Deposition) |
Hour (h) |
Same as above |
|
Delayering Analysis (Delayer) |
Hour (h) |
Hotspot sample delayering analysis |
Service Scope
See service details, sample types
Testing Items
See service details, testing items
Testing Cycle
The standard testing cycle is 3 calendar days. For special requirements, we can provide quotations for different response times: 48h, 24h, and 12h.
Our Advantages
Our team members at GRGTEST Metrology Platform have an average of over 5 years of practical experience in electron microscopy, enabling us to provide accurate, fast, and professional testing services.
Our new generation PFIB microscope tubes can achieve the highest throughput and highest quality cross-section processing and micromachining.
Combined with a final polishing at 500V, we can achieve the highest quality Ga+-free TEM sample preparation.
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