As a professional manufacturer of failure analysis for ensuring sustainable development, failure analysis for fulfilling corporate responsibilities, failure analysis for improving efficiency we can provide competitive prices because we save the extra cost of intermediate processes, and can also provide reliable after-sales service directly. Advanced independent research and development and production levels can escort your business.Since its establishment, our company has been adhering to the sales philosophy of 'customer first, win-win' to provide customers with high-quality failure analysis for contributing to society and professional pre-sales and after-sales services. We have a deep understanding of different cultures and customs, which allows us to provide tailored solutions to meet your unique needs. We hope that our employees will continue to learn and progress in their work, strive to improve their self-quality and cultivation, and do their job better. The continuous expansion of the application field of the whole industry has brought market opportunities and challenges to our company, and at the same time, it has created a great space for the enterprise to enhance its value. You probably feel secure and satisfy when copperate with us. Our research group experiments on various developments during the industry for improvement within the solutions.
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AEC-Q 104 Certification TestingGRGT provides a complete set of AEC-Q 104 certification testing and certification services. By using various testing and analysis techniques and programs to confirm the failure phenomena of products,read more
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Moiré Substrate Warpage TestingA high-precision Moiré-based substrate warpage measurement system that analyzes light diffraction on sample surfaces. Delivers micron-level deformation measurement with a stable thermal cyclingread more
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Advanced FIB & TEM For Wafers AnalysisAdvanced process wafer-level FIB sample preparation and TEM analysis services provide precise sample preparation and structural analysis solutions for advanced process chips by performing FIB sampleread more
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Chip-Level ESD TestingChip-level ESD (Electrostatic Discharge) testing is a reliability test for Integrated Circuits (ICs) used to evaluate a chip's ability to resist electrostatic discharge interference duringread more
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AEC-Q200 Product Test of Resistance-capacitance Inductanc...AEC-200 test standard specifies in detail the operating temperature range of passive components in each component environment in the car, strictly distinguishes the test items of various components,read more
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AEC-Q102 Product Test of Optoelectronic DevicesAEC, composed of Ford, Chrysler and General Motors, has issued the reliability standard AEC-Q102 for optoelectronic devices, which sets strict test requirements for the reliability of optoelectronicread more
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AEC-Q101 Certification Test for Semiconductor Discrete De...AEC-Q101 has sorted out the vehicle reliability requirements for various semiconductor discrete devices. AEC-Q101 test serves as not only a report that can be used worldwide on the reliability ofread more
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AEC-Q100 Certification TestingThe AEC-Q technical team of GRGT Failure Analysis Laboratory has executed a large number of AEC-Q test cases and accumulated rich experience in certification testing, which can provide you with moreread more
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AEC-Q Certification Testing for AutomotiveAs an accepted test specification for automotive-level electronic components in the world, AEC-Q has become a symbol of the quality and reliability in automotive components. AEC-Q certificationread more
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Power Module Aging and Test VerificationGRGT Power Module Aging and Test Verification are suitable for testing various power products such as AC/DC power supplies, module power supplies, medical power supplies, etc.. The power module agingread more
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Metal and Polymer Materials AnalysisWith the rapid development of industrial production, customers have different understandings of high-demand products and processes, resulting in frequent product failures such as cracking, breaking,read more
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Surface Insulation Resistance (SIR) TestThe Surface Insulation Resistance (SIR) test can be used to evaluate problems caused by short circuits or current leaks between metal conductors, helping to identify whether any flux or otherread more
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