Guangzhou – A leading Chinese developer of RAID solid-state storage systems has just cleared the critical "Single-Event-Effect (SEE) Certification" for commercial spaceflight, thanks to turnkey support from GRGTEST's Commercial Space Component Qualification Platform.
Why SEE Certification Matters
SEE qualification is the gatekeeper to the commercial-space supply chain. Every digital IC, memory device, and power MOSFET inside the storage system must be proven immune to single-event upsets (SEU) and single-event latch-up (SEL) under heavy-ion irradiation.
The Technical Hurdle
Flip-chip processors present a unique challenge: the active transistor and memory regions are buried hundreds of micrometers beneath the silicon backside, yet typical Xe, Kr, or Bi beams penetrate only a few tens of micrometers in silicon. Delivering ions deep enough to trigger meaningful SEE events has long been an industry-wide roadblock.
GRGTEST One-Stop Solution
• Custom test boards and fixture design for each package type
• Tailored TID + SEE test plans aligned with mission orbits and radiation spectra
• Direct on-board device testing-eliminating custom daughter-cards and firmware spin cycles
• High-precision heavy-ion accelerator setup for backside penetration and real-time SEE detection
Results
First-pass success with no re-spins, cutting qualification time and eliminating the cost of redundant test-platform builds.
Commercial Space Component Qualification Platform
GRGTEST has already certified processors, memories, and power devices for multiple satellite and payload manufacturers. Our COTS-focused laboratories cover TID, SEE, burn-in, space-environment simulation, and destructive physical analysis-delivering a seamless path from terrestrial lab to orbital flight.
