Screening of Electronic Components

Screening of Electronic Components
Details:
GRG Test has set up electronic component reliability business and can provide users with electronic components testing, evaluation, quality assurance of complete sets of schemes, covering various electronic components screening and testing items, which can eliminate unqualified components, improve the use reliability of electronic components, thus improving the quality and reliability of electroni
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Description
Technical Parameters
PRODUCT DESCRIPTION

 

The one-time screening projects and stress conditions conducted by component manufacturers can hardly meet the needs of equipment development; besides, there are often some industrial or medium and low-grade products and even possibly fake and substandard products in imported components, which makes it hard to ensure the quality and reliability of electronic equipment.

 

Test Cycle

 

2-4 weeks, during which comprehensive screening and testing services for electronic components will be provided; and urgent services are available.

 

Product Scope

 

Resistor; capacitor; magnetic bead; inductor; transformer; crystal oscillator; crystal resonator; relay; semiconductor discrete devices (diode, triode, FET, Darlington array, semiconductor optoelectronic device, etc.); electric connector; switch and panel elements; semiconductor integrated circuit (time base circuit, bus transceiver, buffer, driver, level translator, gate device, trigger, LVDS line transceiver, operational amplifier, voltage regulator, voltage comparator, power chip (voltage regulator, switching power converter, power monitor, power management, etc.), digital to analog converter (A/D, D/A, SRD), memory, programmable logic device, single chip microcomputer, microprocessor, controller, etc.); filter; power module; IGBT, etc.

 

Test Items

 

S/N Test Items Sample Quantity Test Method
1 Visual inspection As requested by customer GJB128, GJB548, etc.
2

Electrical performance test:

Normal temperature test/high temperature test/low temperature test

As requested by customer GB or GJB test method
GJB33,GJB63,GJB65,GJB1042,GJB1432,GJB1648,GJB2438,GJB2138,GJB597,
……
3

Environmental/mechanical stress test:

frequency sweep/random vibration, low temperature storage, high temperature storage, temperature cycle, temperature shock, constant acceleration or drop, sealing (coarse leak detection, fine leak detection), PIND

As requested by customer GJB360,GJB128 ,GJB548,
GJB33,GJB63,GJB65,GJB1042,GJB1432,GJB1648,GJB2438,GJB2138,GJB597,
……
4 Life/aging/burn-in As requested by customer GJB360,GJB128,GJB548
5 Ultrasonic testing of chip bonding As requested by customer GJB548
6 X-ray radiography As requested by customer GJB360,GJB128,GJB548

 

 

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