Test items
(1) Non destructive analysis: X-ray, SAT, OM visual inspection.
(2) Electrical characteristics/electrical positioning analysis: IV curve measurement, Photon Emission, OBIRCH, ATE testing, and three temperature (room temperature/low temperature/high temperature) verification.
(3) Destructive analysis: plastic opening, delamination, board level slicing, chip level slicing, push-pull force testing.
(4) Microscopic analysis: DB FIB section analysis, FESEM examination, EDS micro area elemental analysis.
Test Standards
MIL-STD-883H,GJB128B-2021,MIL-STD-750D,MIL-STD-883G,QJ10003-2008,GB/T19293-2003,JESD22-A103/ A104/ A105/ A108/ A110,J-STD-020,JS-001/002,JESD78
For more testing standards, please contact our online customer service.
Qualifications
Certified by CNAS and over 60 OEMs and Tier1.
Classification Society Approval
Test Cycle
About 3-5 days
Our Srengths
- GRGT has an industry-leading team of experts and advanced failure analysis equipment, which can provide customers with complete failure analysis and testing services
- Assist manufacturers in quickly and accurately locating failures and identifying their root causes
- Provide failure analysis consulting for different applications, assist clients in experimental planning, and provide analysis and testing services based on their research and development needs. If cooperating with customers to carry out NPI stage verification, assist customers in completing batch failure analysis during the mass production stage (MP).
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