Milling Grinding Tests

Ion milling (CP) testing is a process in which a low-pressure inert gas (argon) is ionized in an ion gun under vacuum conditions, and the emitted cations are accelerated to obtain an ion beam with a certain velocity that is projected onto the surface of the sample. Due to the positive charge of ions, their mass is thousands or tens of thousands of times larger than electrons, so ion beams have greater impact kinetic energy than electron beams, and samples are processed by microscopic mechanical impact energy. GRGT has high-end testing equipment and provides one-stop Milling Grinding Tests services.

Mainly used for cross-sectional sampling and interface characterization of semiconductor materials, battery electrode materials, photovoltaic materials, alloys of different hardness, rock minerals, polymer materials, soft hard composite materials, multi-element composition materials, etc.

Milling Grinding Tests can achieve stress free cross-sections and almost all material facets, revealing the internal structure of the sample while minimizing deformation or damage, namely cross-sectional sampling and interface characterization.

Certified by CNAS and over 60 OEMs and Tier1.

• GRGT is one of the most comprehensive and well-known third-party testing institutions in the field of integrated circuits and SiC, having completed chip verification for hundreds of models including MCU, AI chips, and security chips.
• We have the complete service capabilities of AEC-Q and AQG324, which have been recognized by nearly 60 car manufacturers. We have issued nearly 300 AEC-Q and AQG324 reports and assisted in the mass production of over 100 automotive components.

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